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[ACM Press the 2004 ACM SIGKDD international conference - Seattle, WA, USA (2004.08.22-2004.08.25)] Proceedings of the 2004 ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '04 - ANN quality diagnostic models for packaging manufacturing
de Abajo, Nicolás, Diez, Alberto B., Lobato, Vanesa, Cuesta, Sergio R.Year:
2004
Language:
english
DOI:
10.1145/1014052.1016917
File:
PDF, 1.08 MB
english, 2004