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[ACM Press the 2008 workshop - Ischia, Italy (2008.05.05-2008.05.07)] Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies - WREFT '08 - Efficient fault tolerance in multi-media applications through selective instruction replication
Sundaram, Ayswarya, Aakel, Ameen, Lockhart, Derek, Thaker, Darshan, Franklin, DianaYear:
2008
Language:
english
DOI:
10.1145/1366224.1366227
File:
PDF, 306 KB
english, 2008