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Study of lateral Schottky contacts in WSe2 and MoS2 field effect transistors using scanning photocurrent microscopy
YI, Ya, Wu, Changming, Liu, Hong-Chao, Zeng, Jiali, He, Hongtao, Wang, JiannongYear:
2015
Language:
english
Journal:
Nanoscale
DOI:
10.1039/C5NR04592D
File:
PDF, 1.25 MB
english, 2015