Atomic-scale effects behind structural instabilities in Si...

AIP Advances 2012 Vol. 2; Iss. 1

Atomic-scale effects behind structural instabilities in Si lamellae during ion beam thinning

Holmström, E., Kotakoski, J., Lechner, L., Kaiser, U., Nordlund, K.
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Volume:
2
Year:
2012
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.3698411
File:
PDF, 4.09 MB
english, 2012
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