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Microscale thermal characterization at temperatures up to 1000°C by photoreflectance microscopy. Application to the characterization of carbon fibres
Rochais, D, Houëdec, H Le, Enguehard, F, Jumel, J, Lepoutre, FVolume:
38
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/38/10/002
Date:
May, 2005
File:
PDF, 1.12 MB
english, 2005