Analysis of field-plate effects on buffer-related lag phenomena and current collapse in GaN MESFETs and AlGaN/GaN HEMTs
Horio, Kazushige, Nakajima, Atsushi, Itagaki, KeiichiVolume:
24
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/24/8/085022
Date:
August, 2009
File:
PDF, 1.46 MB
english, 2009