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The relevance of electrostatics for scanning-gate microscopy
Schnez, S, Güttinger, J, Stampfer, C, Ensslin, K, Ihn, TVolume:
13
Language:
english
Journal:
New Journal of Physics
DOI:
10.1088/1367-2630/13/5/053013
Date:
May, 2011
File:
PDF, 4.73 MB
english, 2011