Transmission electron microscopy and related techniques for...

Transmission electron microscopy and related techniques for silicon based materials characterization

Alain Claverie, Marie José Casanove
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Volume:
40
Year:
1998
Language:
english
Pages:
12
DOI:
10.1016/s0167-9317(98)00274-3
File:
PDF, 971 KB
english, 1998
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