An Improved Method of Determining Deep Impurity Levels and Profiles in Semiconductors
Goto, Gensuke, Yanagisawa, Shintaro, Wada, Osamu, Takanashi, HirobumiVolume:
13
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.13.1127
Date:
July, 1974
File:
PDF, 158 KB
english, 1974