An Improved Method of Determining Deep Impurity Levels and...

An Improved Method of Determining Deep Impurity Levels and Profiles in Semiconductors

Goto, Gensuke, Yanagisawa, Shintaro, Wada, Osamu, Takanashi, Hirobumi
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Volume:
13
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.13.1127
Date:
July, 1974
File:
PDF, 158 KB
english, 1974
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