Characterization of Interface Instability in InGaAsP LPE...

Japanese Journal of Applied Physics 1985 / 7 Vol. 24; Iss. Part 1, No

Characterization of Interface Instability in InGaAsP LPE Growth on GaAs by Fourier Analysis

Hiramatsu, Kazumasa, Tanaka, Shigeyasu, Sawaki, Nobuhiko, Akasaki, Isamu
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Volume:
24
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.822
Date:
July, 1985
File:
PDF, 512 KB
english, 1985
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