Site Dependence of Soft Errors Induced by Single-Ion...

Japanese Journal of Applied Physics 1992 / 6 Vol. 31; Iss. Part 2, No

Site Dependence of Soft Errors Induced by Single-Ion Hitting in 64 kbit Static Random Access Memory (SRAM)

Noritake, Katsunori, Matsukawa, Takashi, Koh, Meishoku, Hara, Ken-ichi, Goto, Makoto, Ohdomari, Iwao
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Volume:
31
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.L771
Date:
June, 1992
File:
PDF, 578 KB
1992
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