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Nanometer scale patterning by scanning tunelling microscope assisted chemical vapour deposition
F Marchi, D Tonneau, H Dallaporta, R Pierrisnard, V Bouchiat, V.I Safarov, P Doppelt, R EvenVolume:
50
Year:
2000
Language:
english
Pages:
7
DOI:
10.1016/s0167-9317(99)00265-8
File:
PDF, 424 KB
english, 2000