Study of Carrier Emission and Capture Processes at Electron...

Japanese Journal of Applied Physics 1998 / 1 Vol. 37; Iss. Part 2, No

Study of Carrier Emission and Capture Processes at Electron Traps in 3C-SiC

Ichimura, Masaya, Koga, Yoshihiro, Yamada, Noboru, Abe, Tetsushi, Arai, Eisuke, Tokuda, Yutaka
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
37
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.L18
Date:
January, 1998
File:
PDF, 111 KB
english, 1998
Conversion to is in progress
Conversion to is failed