Linearity Study on Enhance/Depletion Dual-Gate High...

Japanese Journal of Applied Physics 1999 / 7 Vol. 38; Iss. Part 1, No

Linearity Study on Enhance/Depletion Dual-Gate High Electron Mobility Transitors using Gain Mapping Method

Tanimoto, Takuma, Kawai, Akie, Ohbu, Isao, Takazawa, Hiroyuki, Nakamura, Tohru
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Volume:
38
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.38.3972
Date:
July, 1999
File:
PDF, 70 KB
english, 1999
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