Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model
Schuler, Franz, Tempel, Georg, Melzner, Hanno, Jacob, Michael, Hendrickx, Paul, Wellekens, Dirk, Van Houdt, JanVolume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.2650
Date:
April, 2002
File:
PDF, 438 KB
english, 2002