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Power-Law Dependence of Charge Trapping on Injected Charge in Very Thin SiO2 Films
Liu, Yang, Chen, Tu Pei, Ang, Chew-Hoe, Fung, SteveVolume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.L384
Date:
April, 2002
File:
PDF, 1.23 MB
english, 2002