Power-Law Dependence of Charge Trapping on Injected Charge...

Japanese Journal of Applied Physics 2002 / 4 Vol. 41; Iss. Part 2, No

Power-Law Dependence of Charge Trapping on Injected Charge in Very Thin SiO2 Films

Liu, Yang, Chen, Tu Pei, Ang, Chew-Hoe, Fung, Steve
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Volume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.L384
Date:
April, 2002
File:
PDF, 1.23 MB
english, 2002
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