Single Event Upset in Static Random Access Memories in...

Japanese Journal of Applied Physics 2003 / 7 Vol. 42; Iss. Part 2, No

Single Event Upset in Static Random Access Memories in Atmospheric Neutron Environments

Arita, Yutaka, Takai, Mikio, Ogawa, Izumi, Kishimoto, Tadafumi
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Volume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.42.L738
Date:
July, 2003
File:
PDF, 275 KB
english, 2003
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