Effect of Grain Curvature on Nano-Indentation Measurements of Thin Films
Tsai, Kuang-Yue, Chin, Tsung-Shune, Shieh, Han-Ping D.Volume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.6268
Date:
September, 2004
File:
PDF, 209 KB
english, 2004