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Statistical Parameter Extraction for Intra- and Inter-Chip Variabilities of Metal–Oxide–Semiconductor Field-Effect Transistor Characteristics
Okada, Kenichi, Onodera, HidetoshiVolume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.131
Date:
January, 2005
File:
PDF, 213 KB
english, 2005