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Effects of Ag Thickness and Deposition Temperature on Prevention of Cu Diffusion in Cu/Ag/Si System
Yukawa, Motonobu, Kitagawa, Hiroki, Iida, ShojiVolume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.3187
Date:
May, 2005
File:
PDF, 857 KB
english, 2005