Experimental Study on the Universality of Mobility Behavior...

Japanese Journal of Applied Physics 2005 / 6 Vol. 44; Iss. 6A

Experimental Study on the Universality of Mobility Behavior in Ultra Thin Body Metal Oxide Semiconductor Field Effect Transistors

Tsutsui, Gen, Saitoh, Masumi, Nagumo, Toshiharu, Hiramoto, Toshiro
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Volume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.3889
Date:
June, 2005
File:
PDF, 103 KB
english, 2005
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