Variable Interference Azimuth Angle in Double-Biprism Electron Interferometry
Harada, Ken, Akashi, Tetsuya, Togawa, Yoshihiko, Matsuda, Tsuyoshi, Tonomura, AkiraVolume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.L636
Date:
May, 2005
File:
PDF, 380 KB
english, 2005