Reliability Analysis of Ultra Low-Temperature...

Japanese Journal of Applied Physics 2007 / 3 Vol. 46; Iss. 3B

Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Ueno, Hitoshi, Sugawara, Yuta, Yano, Hiroshi, Hatayama, Tomoaki, Uraoka, Yukiharu, Fuyuki, Takashi, Jung, Ji Sim, Park, Kyung Bae, Kim, Jong Man, Kwon, Jang Yeon, Noguchi, Takashi
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Volume:
46
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.46.1303
Date:
March, 2007
File:
PDF, 296 KB
english, 2007
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