Control of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration
Kayashima, Sho, Takahashi, Keisuke, Motoyama, Motoaki, Shirakashi, Jun-ichiVolume:
46
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.46.L907
Date:
September, 2007
File:
PDF, 746 KB
english, 2007