Impact of Gate Overlap on Performance of Schottky Barrier...

Japanese Journal of Applied Physics 2008 / 4 Vol. 47; Iss. 4

Impact of Gate Overlap on Performance of Schottky Barrier Metal–Oxide–Semiconductor Field-Effect Transistors Including Gate Induced Barrier Lowering Effect

Zeng, Lang, Liu, Xiao-Yan, Du, Gang, Kang, Jin-Feng, Han, Ru-Qi
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Volume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.47.2660
Date:
April, 2008
File:
PDF, 71 KB
english, 2008
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