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Characteristics of tantalum pentoxide dielectric films deposited on silicon by excimer-lamp assisted photo-induced CVD using an injection liquid source
M.B. Mooney, P.K. Hurley, B.J. O'Sullivan, J.T. Beechinor, J.-Y. Zhang, I.W. Boyd, P.V. Kelly, J.-P. Sénateur, G.M. Crean, C. Jimenez, M. PaillousVolume:
48
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0167-9317(99)00389-5
File:
PDF, 456 KB
english, 1999