Structural properties of thin films of high dielectric...

Structural properties of thin films of high dielectric constant materials on silicon

H.C. Lu, N. Yasuda, E. Garfunkel, T. Gustafsson, J.P. Chang, R.L. Opila, G. Alers
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Volume:
48
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0167-9317(99)00390-1
File:
PDF, 400 KB
english, 1999
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