Single-Electron Charging in Phosphorus Donors in Silicon...

Japanese Journal of Applied Physics 2011 / 8 Vol. 50; Iss. 8

Single-Electron Charging in Phosphorus Donors in Silicon Observed by Low-Temperature Kelvin Probe Force Microscope

Anwar, Miftahul, Kawai, Yuya, Moraru, Daniel, Nowak, Roland, Jablonski, Ryszard, Mizuno, Takeshi, Tabe, Michiharu
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Volume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.08LB10
Date:
August, 2011
File:
PDF, 143 KB
english, 2011
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