[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - A high-level compact pattern-dependent delay model for high-speed point-to-point interconnects
Murgan, Tudor, Momeni, Massoud, Ortiz, Alberto García, Glesner, ManfredYear:
2006
Language:
english
DOI:
10.1145/1233501.1233565
File:
PDF, 208 KB
english, 2006