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The effects of prolonged high-voltage STM scanning on an oxidized silicon wafer surface
Pischow, K A, Molarius, J MVolume:
5
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/5/2/003
Date:
April, 1994
File:
PDF, 1013 KB
english, 1994