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[IEEE 2015 Annual Reliability and Maintainability Symposium (RAMS) - Palm Harbor, FL, USA (2015.1.26-2015.1.29)] 2015 Annual Reliability and Maintainability Symposium (RAMS) - Measuring reliability during product development considering aleatory and epistemic uncertainty
Zeng, Zhiguo, Kang, Rui, Wen, Meilin, Chen, YunxiaYear:
2015
Language:
english
DOI:
10.1109/RAMS.2015.7105067
File:
PDF, 342 KB
english, 2015