Crystal Defects of Silicon Films Formed by Molecular Beam...

Crystal Defects of Silicon Films Formed by Molecular Beam Epitaxy

Sugiura, Hideo, Yamaguchi, Masafumi
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Volume:
19
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.19.583
Date:
April, 1980
File:
PDF, 790 KB
1980
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