Barrier Effects of Tungsten Infer-Layer for Aluminum Diffusion in Aluminum/Silicon Ohmic-Contact System
Hara, Tohru, Enomoto, Shuichi, Ohtsuka, Noboru, Shima, ShoheiVolume:
24
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.828
Date:
July, 1985
File:
PDF, 254 KB
english, 1985