High-Resolution Transmission Electron Microscopy of Defects...

Japanese Journal of Applied Physics 1989 / 11 Vol. 28; Iss. Part 2, No

High-Resolution Transmission Electron Microscopy of Defects in YBa 2 Cu 4 O 8

Yamaguchi, Koji, Miyatake, Takayuki, Takata, Tsutomu, Gotoh, Satoshi, Koshizuka, Naoki, Tanaka, Shoji
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Volume:
28
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.L1942
Date:
November, 1989
File:
PDF, 389 KB
english, 1989
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