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Cracking Yield Dependence of InP Growth by Chemical Beam Epitaxy
Uchida, Toshi K., Uchida, Takashi, Yokouchi, Noriyuki, Mise, Kazuaki, Koyama, Fumio, Iga, KenichiVolume:
29
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.L1738
Date:
October, 1990
File:
PDF, 179 KB
english, 1990