Evaluation of the Si-SiO 2...

Japanese Journal of Applied Physics 1990 / 12 Vol. 29; Iss. Part 2, No

Evaluation of the Si-SiO 2 Interface by the Measurement of the Surface Recombination Velocity S by the Dual-Mercury Probe Method

Suzuki, Eiichi, Takato, Hidetaka, Ishii, Kenichi, Hayashi, Yutaka
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Volume:
29
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.L2300
Date:
December, 1990
File:
PDF, 499 KB
english, 1990
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