Carrier Lifetime Depth Profile for Power Devices with Fast Turn-On Time Investigated by Photoluminescence Decay Method
Yahata, Akihiro, Kuriki, MinoruVolume:
31
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.1758
Date:
June, 1992
File:
PDF, 76 KB
english, 1992