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Characterization of GeSi/Si Heteroepitaxial Layered Structures by Convergent Beam Electron Diffraction
Shao, G., Yang, Z., Weiss, B. L.Volume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.404
Date:
January, 1993
File:
PDF, 233 KB
1993