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Charge Collection Control Using Retrograde Well Tested by Proton Microprobe Irradiation
Sayama, Hirokazu, Kimura, Hiroshi, Ohno, Yoshikazu, Satoh, Shinichi, Sonoda, Kenichirou, Kotani, Norihiko, Takai, MikioVolume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.6287
Date:
December, 1993
File:
PDF, 343 KB
english, 1993