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Influence of Grain Boundary Configuration in Aluminum Films on Abrupt Resistance Changes during Electromigration
Hong, Chao-Fu, Togo, Mitsuhiro, Hoh, KoichiroVolume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.L247
Date:
February, 1993
File:
PDF, 838 KB
english, 1993