Influence of Interface Barrier on Lateral Transport Properties for Metal/Semiconductor Systems
Yamamoto, Sekika, Ohyama, Tyuzi, Otsuka, Eizo, Yamauchi, Syouichi, Iwami, MotohiroVolume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.3971
Date:
July, 1994
File:
PDF, 1.05 MB
1994