Characterization of Au Thin Film by Glancing-Incidence and...

Japanese Journal of Applied Physics 1994 / 9 Vol. 33; Iss. Part 2, No

Characterization of Au Thin Film by Glancing-Incidence and -Takeoff X-Ray Fluorescence Spectroscopy

Tsuji, Kouichi, Sato, Shigeo, Hirokawa, Kichinosuke
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Volume:
33
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L1277
Date:
September, 1994
File:
PDF, 332 KB
english, 1994
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