Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope
Ohta, Masahiro, Sugawara, Yasuhiro, Hontani, Kouji, Morita, Seizo, Osaka, Fukunobu, Suzuki, Mineharu, Nagaoka, Hideki, Mishima, Shuzo, Okada, TakaoVolume:
33
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L52
Date:
January, 1994
File:
PDF, 185 KB
english, 1994