Monte Carlo Simulation of Generations of Continuous and Characteristic X-Rays by Electron Impact
Fujii, Kentaro, Nagatomi, Takaharu, Kimura, Yoshihide, Takai, Yoshizo, Shimizu, Ryuichi, Obori, Ken-ichi, Yurugi, ToshikazuVolume:
39
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.39.2863
Date:
May, 2000
File:
PDF, 190 KB
english, 2000