Measurement of Dielectric Property by Evanescent Microwave...

Japanese Journal of Applied Physics 2002 / 11 Vol. 41; Iss. Part 1, No

Measurement of Dielectric Property by Evanescent Microwave Microscope

Chen, Yi-Chun, Cheng, Hsiu-Fung, Wang, Gang, Xiang, Xiao-Dong, Lei, Chien-Ming, Lin, I-Nan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.7214
Date:
November, 2002
File:
PDF, 466 KB
english, 2002
Conversion to is in progress
Conversion to is failed