Hot Carrier Degradations of Dynamic Threshold Silicon on...

Japanese Journal of Applied Physics 2004 / 4 Vol. 43; Iss. 4A

Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal–Oxide–Semiconductor Field Effect Transistors

Chao, Tien-Sheng, Lee, Yao-Jen, Huang, Chun-Yang, Lin, Horng-Chih, Li, Yiming, Huang, Tiao-Yuan
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Volume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.1300
Date:
April, 2004
File:
PDF, 494 KB
english, 2004
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