![](/img/cover-not-exists.png)
Electrical Characterization of Sub-micron Magnetic Tunneling Junction Cells Using Scanning Probe Microscopy
Park, Seungbae, Heo, Jinhee, Kim, T. W., Chung, IlsubVolume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.2230
Date:
April, 2004
File:
PDF, 305 KB
english, 2004