Electrical Characterization of Sub-micron Magnetic...

Electrical Characterization of Sub-micron Magnetic Tunneling Junction Cells Using Scanning Probe Microscopy

Park, Seungbae, Heo, Jinhee, Kim, T. W., Chung, Ilsub
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Volume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.2230
Date:
April, 2004
File:
PDF, 305 KB
english, 2004
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