Evaluation of Fast Neutron Induced Single Event Upset in a...

Evaluation of Fast Neutron Induced Single Event Upset in a Static Random Access Memory and Simulation by Monte Carlo N-Particle Code (MCNPX)

Arita, Yutaka, Takai, Mikio, Ogawa, Izumi, Kishimoto, Tadafumi, Nagai, Yasuki, Hatanaka, Kichiji, Matsuoka, Nobuyuki
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Volume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.L797
Date:
June, 2004
File:
PDF, 216 KB
english, 2004
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