Connection Test of Area Bump Using Active-Matrix Switches

Japanese Journal of Applied Physics 2005 / 4 Vol. 44; Iss. 4B

Connection Test of Area Bump Using Active-Matrix Switches

Watanabe, Naoya, Hasegawa, Satoshi, Asano, Tanemasa
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Volume:
44
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.2770
Date:
April, 2005
File:
PDF, 343 KB
2005
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