Effect of Mixed-Mode Electrical Stress on High-Frequency...

Japanese Journal of Applied Physics 2008 / 4 Vol. 47; Iss. 4

Effect of Mixed-Mode Electrical Stress on High-Frequency and RF Power Characteristics of SiGe Hetero-Junction Bipolar Transistors

Hung, Cheng-Chou, Liao, Wen-Shiang, Huang, Sheng-Yi, Chen, Kun-Ming, Huang, Guo-Wei, Lien, Chen-Hsin
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Volume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.47.2872
Date:
April, 2008
File:
PDF, 489 KB
english, 2008
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